- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders
Patent holdings for IPC class G01Q 60/38
Total number of patents in this class: 281
10-year publication summary
9
|
15
|
14
|
24
|
22
|
29
|
34
|
24
|
20
|
6
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Bruker Nano, Inc. | 334 |
25 |
Centre National de La Recherche Scientifique | 9632 |
10 |
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2362 |
10 |
The Regents of the University of California | 18943 |
7 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
5 |
President and Fellows of Harvard College | 5792 |
5 |
Veeco Instruments Inc. | 332 |
5 |
Vmicro | 9 |
5 |
Shimadzu Corporation | 5791 |
4 |
Carl Zeiss SMT GmbH | 2646 |
4 |
Park Systems Corp. | 27 |
4 |
Shenyang Institute of Automation, Chinese Academy of Sciences | 77 |
4 |
UT-Battelle, LLC | 1333 |
4 |
AMG Technology Ltd. | 7 |
4 |
International Business Machines Corporation | 60644 |
3 |
The Board of Trustees of the University of Illinois | 2623 |
3 |
Angstrom Science, Inc. | 4 |
3 |
DCG Systems, Inc. | 68 |
3 |
Kyoto University | 2732 |
3 |
Hitachi, Ltd. | 16452 |
2 |
Other owners | 168 |